Issues »  Volume 11, Issue 1

Techniques for X-Ray Focusing

V. Yu. Storizhko$^{1}$, M. V. Il’yashenko$^{1}$, V. B. Molodkin$^{2}$, O. Yu. Gayevsky$^{2}$, V. L. Denysenko$^{1}$, O. I. Denysenko$^{1}$, S. O. Vershynsky$^{1}$

$^1$Institute of Applied Physics, NAS of Ukraine, 58 Petropavlivska Str., 40000 Sumy, Ukraine
$^2$G.V. Kurdyumov Institute for Metal Physics, NAS of Ukraine, 36 Academician Vernadsky Blvd., UA-03142 Kyiv, Ukraine

Received: 16.10.2009. Download: PDF

Physical grounds of X-ray focusing and technological requirements for X-ray optics system’ are considered. Data on various focusing methods and analyzing X-ray radiation, their using, available and prospective parameters of facilities are systematized. Advantages and disadvantages of available methods are analyzed.

Keywords: X-ray radiation, X-ray optic system.

PACS: 07.85.Qe, 07.85.Tt, 41.50.+h, 61.05.cp, 68.37.Yz, 81.70.-q, 87.59.-e

DOI: https://doi.org/10.15407/ufm.11.01.001

Citation: V. Yu. Storizhko, M. V. Il’yashenko, V. B. Molodkin, O. Yu. Gayevsky, V. L. Denysenko, O. I. Denysenko, and S. O. Vershynsky, Techniques for X-Ray Focusing, Usp. Fiz. Met., 11, No. 1: 1—17 (2010) (in Russian), doi: 10.15407/ufm.11.01.001

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