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Issues »  Volume 11, Issue 1

Techniques for X-Ray Focusing

V. Yu. Storizhko1, M. V. Il’yashenko1, V. B. Molodkin2, O. Yu. Gayevsky2, V. L. Denysenko1, O. I. Denysenko1, S. O. Vershynsky1

1Institute of Applied Physics, NAS of Ukraine, 58 Petropavlivska Str., 40000 Sumy, Ukraine
2G.V. Kurdyumov Institute for Metal Physics, NAS of Ukraine, 36 Academician Vernadsky Blvd., UA-03142 Kyiv, Ukraine

Received: 16.10.2009. Download: PDF

Physical grounds of X-ray focusing and technological requirements for X-ray optics system’ are considered. Data on various focusing methods and analyzing X-ray radiation, their using, available and prospective parameters of facilities are systematized. Advantages and disadvantages of available methods are analyzed.

Keywords: X-ray radiation, X-ray optic system.

PACS: 07.85.Qe, 07.85.Tt, 41.50.+h, 61.05.cp, 68.37.Yz, 81.70.-q, 87.59.-e

DOI: https://doi.org/10.15407/ufm.11.01.001

Citation: V. Yu. Storizhko, M. V. Il’yashenko, V. B. Molodkin, O. Yu. Gayevsky, V. L. Denysenko, O. I. Denysenko, and S. O. Vershynsky, Techniques for X-Ray Focusing, Usp. Fiz. Met., 11, No. 1: 1—17 (2010) (in Russian), doi: 10.15407/ufm.11.01.001

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