Issues »  Volume 8, Issue 4

Structural-Phase State, Stability of Interfaces and Electrophysical Properties of Two-Layer Film Systems

S. I. Protsenko, I. V. Cheshko, D. V. Velykodnyj, I. V. Pazukha, L. V. Odnodvorets’, I. Yu. Protsenko, O. V. Synashenko

Sumy State University, 2 Rymsky-Korsakov Str., UA-40007 Sumy, Ukraine

Received: 13.09.2007. Download: PDF

The generalized literary data and results of own experimental investigations of structural and phase state, stability of interfaces and electrophysical properties (thermal coefficient of resistance (TCR) and strain-gauge factor (SGF)) for two-layer film systems, Cu/(Co, Ag or Au), Cu/(Cr or Fe) and Fe/Cr, are presented. The choice of these systems is caused by stabilization of various structural and phase states in them such as granular solid solutions (systems based on Cu and Co, Ag or Au), solid solutions (Fe/Cr), two-layer systems with conservation of individuality of separate layers (biplate) (Cu/Cr and Cu/Fe systems (below 700 K)). Experimental results for TCR and SGF agree well or satisfactory with relationships for TCR and SGF of the biplate, film alloy or two-layer system with an intermediate layer of solid solution near the interface. It can serve as an additional argument in favour of conclusions concerning structural and phase state of two-layer system.

Keywords: interface, structural-phase state, solid solution, granular alloy, TCR, tensosensitivity coefficient.

PACS: 68.35.Ct, 68.55.Jk, 68.55.Nq, 68.60.Dv, 73.40.Jn, 73.61.At, 73.63.Bd

DOI: https://doi.org/10.15407/ufm.08.04.247

Citation: S. I. Protsenko, I. V. Cheshko, D. V. Velykodnyj, I. V. Pazukha, L. V. Odnodvorets’, I. Yu. Protsenko, and O. V. Synashenko, Structural-Phase State, Stability of Interfaces and Electrophysical Properties of Two-Layer Film Systems, Usp. Fiz. Met., 8, No. 4: 247—278 (2007) (in Ukrainian), doi: 10.15407/ufm.08.04.247

References (62)  
  1. Sh. Kovach, B. Dani, S. R. Teygzeyra et al., FMM, 79, No. 1: 98 (1995).
  2. І. Yu. Protsenko, І. V. Cheshko, Ya. Yavors'kiy, Vіsnik SumDU, No. 10 (69): 65 (2004).
  3. V. V.Skorokhod, І. V. Uvarova, A. V. Ragulya, Fіziko-khіmіchna kіnetika v nanostrukturnikh sistemakh (Kyiv: Akademperіodika: 2001).
  4. V. І. Dybkov, Tverdofazna khіmіchna kіnetika і reaktsіyna difuzіya (Kyiv: ІPM: 2002).
  5. S. P. Chizhik, N. T. Gladkikh, L. K. Grigor'eva et al., Metally, No. 2: 175 (1985).
  6. V. P. Ampilogov, Rost i struktura nanorazmernykh orientirovannykh geterostruktur s organicheskoy vzaimnoy rastvorimost'yu komponentov (Dis. … kand. fiz.-mat. nauk) (Voronezh: VGTU: 2007).
  7. M. Kitada, J. Magnet. Magn. Mat., 208: 244 (2000).
  8. A. Aziz, S. M. Thompson, K. Ounadjela et al., J. Magnet. Magn. Mat., 148: 313 (1995).
  9. K. Yamamoto and M. Kitada, Thin Solid Films, 263: III (1995). Crossref
  10. I. Protsenko, I. Cheshko, and Ja. Javorsky, Functional Materials, 13, No. 2: 219 (2006).
  11. G. H. Yang, K. W. Geng, F. Zeng et al., Thin Solid Films, 484: 283 (2005). Crossref
  12. M. Marszalek, I. Cheshko, O. Synashenko, and I. Protsenko, Book of Abstracts Workshop on Smoothing and Characterization of Magnetic Films for Advanced Devices (Krakow: AGH UST: 2007).
  13. S. M. Voloshko, S. I. Sidorenko, I. N. Makeeva, Metallofiz. Noveishie Tekhnol., 16, No. 10: 61 (1994).
  14. І. Yu. Protsenko, A. M. Chornous, І. O. Shpetniy, Vіsnik L'vіvs'kogo natsіonal'nogo unіversitetu. Serіya fіzichna, No. 36: 116 (2003).
  15. I. A. Garifullin, N. N. Garif'yanov, R. I. Salikhov, Izv. RAN. Ser. fizich., 71, No. 2: 280 (2007).
  16. V. V. Bіbіk, L. V.Odnodvorets', І. O. Shpetniy, Vіsnik SumDU, No. 9 (93): 91 (2006).
  17. V. V. Bіbіk, L. V. Odnodvorets', N. І. Shumakova, S. І. Protsenko, Vіsnik SumDU, No. 6 (90): 47 (2006).
  18. S. Kundu, Nucl. Instr. and Meth. in Phys. Res. B, 242: 542 (2006).
  19. Y. Chushkin, M. Jergel, S. Luby et al., Appl. Sur. Sci., 243: 62 (2005). Crossref
  20. N. R. Shamsutdinov, A. J. Bottger, and F. D. Tichelaar, Scripta Mat., 54: 1727 (2006).
  21. L. V. Dekhtyaruk, І. Yu. Protsenko, A. M. Chornous, Usp. Fiz. Met., 8, No. 1: 21 (2007). Crossref
  22. L. V. Dekhtyaruk, І. M. Pazukha, І. Yu. Protsenko, UFZh, 51, No. 7: 729 (2006).
  23. Ye. O. Zabіla, L. V. Odnodvorets', S. І.Protsenko et al., Vіsnik SumDU, No. 8 (54): 71 (2003).
  24. І. M. Pazukha, S. І. Protsenko, І. Yu. Protsenko et al., Vіsnik SumDU, No. 9 (93): 7 (2006).
  25. S. Zang and P. M. Levy, Phys. Rev. B, 57, No. 9: 5336 (1998). Crossref
  26. R. Banerjee, R. Ahuja, S. Swaminathan et al., Thin Solid Films, 269: 29 (1995).
  27. P. F. Carsia and A. Suna, J. Appl. Phys., 54, No. 4: 2000 (1983).
  28. J. W. C. de Vries, Solid State Com., 65, No. 3: 201 (1988).
  29. O. Sinashenko, І. Protsenko, Tezi dopovіdey Mіzhnarodnoi konferentsії EVRIKA-2007 (L'vіv: LNU: 2007).
  30. Yu. M. Ovcharenko, N. M.Opanasyuk, І. Yu. Protsenko et al., UFZh, 42, No. 7: 826 (1997).
  31. T. Lorenz, M. Moske, H. Geisler et al., Thin Solid Films, 275: 220 (1996).
  32. M. Gester, K. Ounadjela, J. F. Gregg et al., J. Magnet. Magn. Mat., 165: 323 (1997).
  33. E. Agostinelli, D. Fiorari, S. Foglia et al., Mat. Sci. and Engineering, 19: 151 (2002).
  34. J. A. De Toro, J. P. Anders, J. A. Gounzalez et al., Phys. Rev. B, 70: 224412 (2004). Crossref
  35. F. Stobiecki, B. Szymanski, T. Lucinski et al., J. Magnet. Magn. Mat., 202: 276 (2002).
  36. F. Spizzo, E. Angeli, D. Bisero et al., J. Magnet. Magn. Mat., 242–245: 473 (2002).
  37. D. L. Khalyapin, Magnitnye svoystva i struktura plenok nanokristallicheskikh splavov Co–Cu, formiruemykh posledovatel'nym napyleniem komponentov. (Dis. … kand. fiz.-mat. nauk) (Krasnoyarsk: In-t fiziki SO RAN: 2005).
  38. K. Marszalek, M. Marszalek, S. Protsenko et al., Materialy Konferensyjna 'COE 2006' (Krakow–Zakopane: 2006).
  39. V. V. Bіbіk, T. M. Grichanovs'ka, M. Marshalek et al., Metallofiz. Noveishie Tekhnol., 28, No. 6: 707 (2006).
  40. M. Marszalek, J. Jaworsi, M. Kas et al., Vacuum, 74: 287 (2004).
  41. Z. Ziman, A. F. Sіrenko, Osnovi fіzichnogo materіaloznavstva (Kharkіv: KhNU іm. V. N. Karazіna: 2005).
  42. L. V. Odnodvorets, S. I. Protsenko, A. I. Saltykova, Metallofiz. Noveishie Tekhnol., 21, No. 8: 71 (1999).
  43. S. Kundu, Nucl. Instr. and Meth. in Phys. Res. B, 212: 489 (2003).
  44. M. Gonzales-Silveira, J. Rodriguez-Viejo, M. T. Clavaduera-Mora et al., Phys. Rev. B., 75: 075419-1 (2007).
  45. V. M. Fedosyuk, D. I. Vil'yams, Kh. I. Blayt et al., Metallofiz. Noveishie Tekhnol., 18, No. 11: 17 (1996).
  46. C. Oprea, A. P. Kobzev, M. Codescu et al., ION 2006 (Kazimiers Dolny: 2006)
  47. C. Oprea, A. P. Kobzev, M. Codescu et al., Vacuum, 2007 (to be published).
  48. V. V. Chernyshov, S. D. Kaloshkin, V. N.Serdyuk et al., FMM, 97, No. 4: 71 (2004).
  49. P. Gorria, D. Martinez-Blanco, J. A. Blanko et al., Physica B, 384: 336 (2006).
  50. N. R. Shamsutrinov, A. J. Bottger, F. D. Tichelaar, Scripta Mater., 54: 1727 (2006).
  51. T. Koziel, Z. Kedzierski, A. Zielinska-Lipiec et al., Scripta Mater., 54: 1990 (2006).
  52. J. Y. Huang, J. Z. Jiang, H. Yasuda et al., Phys. Rev. B, 58, No. 18: 11817 (1998).
  53. L. V. Odnodvorets', S. І. Protsenko, A. M. Chornous ta іn., Usp. Fiz. Mmet., 8, No. 2: 109.
  54. S. І. Protsenko, A. M. Chornous, Metallofiz. Noveishie Tekhnol., 25, No.5: 587 (2003).
  55. Є. O. Zabіla, І. Yu. Protsenko, UFZh, 50, No. 7: 729 (2005).
  56. S. Protsenko, Materіali XI Mіzhnarodnoi konferentsії «Fіzika і tekhnologіya tonkikh plіvok і nanosistem» (Іvano-Frankіvs'k.: PrNU: 2007), vol. 1.
  57. G.-F. Wang, X.-Q. Feng, S. W. Yu et al., Mat. Sci. Eng. A, 363: 1 (2003).
  58. P. J. W. Janssen, Th. H. de Keijser, and M. g. D. Geers, Mat. Sci. Eng. A, 419: 238 (2006).
  59. D. Son, J.-H. Jeong, and D. Kwon, Thin Solid Films, 437: 182 (2003).
  60. D. Son, J.-j. Kim, T. W. Lim et al. Scripta Mater., 50: 1265 (2004).
  61. S. U. Jen and T. C. Wu, Thin Solid Films, 492: 166 (2005).
  62. N. P. Klokova, Tenzometriya (Moskva: Mashinostroenie: 1990).

© 2013–2018 "G.V. Kurdyumov Institute for Metal Physics"