Issues »  Volume 6, Issue 2

Optical and Magnetooptical Spectroscopy of the Nanostructural Multilayered Films: Possible Applications

Yu. V. Kudryavtsev$^{1}$, V. M. Uvarov$^{1}$, R. Gontarz$^{2}$, J. Dubowik$^{2}$, Y. P. Lee$^{3}$, J. Y. Rhee$^{4}$, Yu. N. Makogon$^{5}$, E. P. Pavlova$^{5}$

$^1$G.V. Kurdyumov Institute for Metal Physics, NAS of Ukraine, 36 Academician Vernadsky Blvd., UA-03142 Kyiv, Ukraine
$^2$Institute of Molecular Physics PAN, ul. Mariana Smoluchowskiego 17, 60-179 Poznań, Poland
$^3$q-Psi and Department of Physics, Hanyang University, Seoul, 133-791, Republic of Korea
$^4$Department of Physics, Hoseo University, Asan, Choongnam, 336-795, Republic of Korea
$^5$National Technical University of Ukraine ‘Igor Sikorsky Kyiv Polytechnic Institute’, 37 Peremohy Ave., UA-03056 Kyiv, Ukraine

Received: 13.01.2005. Download: PDF

The aim of the paper is to show the potential of the spectroscopic ellipsometry and magnetooptical (MO) spectroscopy for probing of the multilayered films (MLF) with sublayer thickness of about a few nanometres. The main approach applied by us is based on the comparison of the experimental optical and MO properties with the simulated ones based on various models of the MLF. Specifically, as shown, such an approach can be useful for studying the nature of unusual MO properties and the interfaces in MLF comprising the noble and $3d$-transition metals ($3d$-TM). The high sensitivity of the applied spectroscopic methods for the monitoring of the solid-state reactions in the $3d$-TM/Si MLF induced by ion-beam treatment or by thermal annealing is also demonstrated. The optical properties of various silicides formed spontaneously or induced by various treatments at interfaces are evaluated experimentally and compared with the results of first-principle calculations.

Keywords: spectroscopic ellipsometry, magnetooptical spectroscopy, multi-layered films, solid-state reactions, ion-beam mixing.

PACS: 75.70.-i, 78.20.Bh, 78.20.Ls, 78.66.-w, 78.67.-n, 79.20.Rf

DOI: https://doi.org/10.15407/ufm.06.02.135

Citation: Yu. V. Kudryavtsev, V. M. Uvarov, R. Gontarz, J. Dubowik, Y. P. Lee, J. Y. Rhee, Yu. N. Makogon, and E. P. Pavlova, Optical and Magnetooptical Spectroscopy of the Nanostructural Multilayered Films: Possible Applications, Usp. Fiz. Met., 6, No. 2: 135—168 (2005), doi: 10.15407/ufm.06.02.135

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