Issues »  Volume 2, Issue 1

Influence of Twinning Microstructure of Crystals with Low Tetragonality on a X-Ray Diffraction

A. I. Ustinov$^{1}$, L. O. Olikhovs'ka$^{1}$, J.-C. Niepce$^{2}$, F. Bernard$^{2}$

$^1$G.V. Kurdyumov Institute for Metal Physics, NAS of Ukraine, 36 Academician Vernadsky Blvd., UA-03142 Kyiv, Ukraine
$^2$UFR Sciences et Techniques, Universite de Bourgogne, 9 avenue Alain Savary, 21078 Dijon, France

Received: 08.09.2000. Download: PDF

The intensity distributions of the X-rays scattered in the tetragonal single crystal, which represent a complex of the twin domains separated by the coherent parallel boundaries, are simulated. The calculations are performed by using the Monte Carlo method within the framework of a kinematical approach. The thickness distributions of the twin domains are defined according to the geometrical, Gaussian and log normal functions. ‘Critical’ effects of the X-ray scattering are found, namely there is transformation of the tetragonal doublet into singlet or multiplet. As demonstrated, each of characteristics of the tetragonal doublet profile depends on a few parameters of the twin microstructure of a crystal and cell tetragonality as well.

Keywords: X-ray diffraction, diffuse scattering, tetragonal crystal, twins, satellite.

PACS: 61.10Dp, 61.10.Eq, 61.66.Fn, 61.72.Bb, 61.72.Ff, 61.72.Mm

DOI: https://doi.org/10.15407/ufm.02.01.051

Citation: A. I. Ustinov, L. O. Olikhovs'ka, J.-C. Niepce, and F. Bernard, Influence of Twinning Microstructure of Crystals with Low Tetragonality on a X-Ray Diffraction, Usp. Fiz. Met., 2, No. 1: 51—84 (2001) (in Russian), doi: 10.15407/ufm.02.01.051

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